| Tuesday 7 September |
| |
Chairman: Torkild Eivindson |
| 0900 |
Dr. Lorentz Petter Lossius (invited speaker), Hydro Aluminium PM, Årdal, Norway
Using Quantitative XRD Phase Analysis to Improve Standardless XRF Elemental Analysis |
| 0945 |
Dr. Andreas Grimstvedt, Geological Survey of Norway, Trondheim, Norway
Kvantifisering med XRD. Eksempel på "Full Pattern" kvantitativ analyse utført i MS-Excel
(Quantifying with XRD. Example of Full Pattern quantitative analysis with MS-Excel) |
| 1005 |
Coffee |
| 1030 |
Arne Eriksson, Spectral Solutions (Bruker AXS), Stockholm, Sweden
Super Speed Solutions in X-Ray Diffraction |
| 1050 |
Uli Riedel, PANalytical , The Netherlands
Phase identification made easy! 2 practical examples how complex problems can be solved |
| 1135 |
Lunch |
| |
Chairman: Torkild Eivindson |
| 1330 |
Dr. John Sieber (invited speaker), National Institute of Standards and Technology (NIST), USA
Traceability, validation & uncertainty in quantitative X-RAY fluorescence |
| 1415 |
Stefan Kazikowski, Eka Chemicals AB, Sweden
Certifierade Standarder, Pulver och Glas. Utvärderade med UniQuant/IQ+
(Certified Standards, Powder, and Glass. Examined with UniQuant/IQ+) |
| 1435 |
Dr. Bertil Magnusson, SP, Sweden
Measurement uncertainty according to the Nodtest Handbook – Example with determination of Si with XRF. |
| 1505 |
Coffee |
| 1530 |
Clemens Schäfer, Spectro A.I., Germay
Micro XRF, filling the gap between SEM/EDS and conventional XRF |
| 1615 |
Dr. Elke Thisted, Elkem Central Laboratory, Kristiansand, Norway
XRF analysis of P in Si-metal |
| 1635 |
Didier Bonvin, Anton Kleyn and Ravi Yellepeddi, Thermo Electron Corp. Switzerland
Matching XRF Solutions with Analytical needs: Challenges and Choice |
| 1720 |
Torkild Eivindson, Elkem Central Laboratory, Kristiansand, Norway
Analyseprogram for kontroll av XRF-instrument
(An analytical program to control an XRF-instrument) |
| 1740 |
End |
| 1930 |
Banquet |