PROGRAM
FOR
THE 13th NORWEGIAN X-RAY SEMINAR
6 - 8 SEPTEMBER 2004

QUALITY HOTEL, KRISTIANSAND

 

Monday 6 September
1100 REGISTRATION
1200 LUNCH
  Chairman: John T Håkedal
1300 Åge Storm, Opening.
1310 Prof. Emeritus James Willis (invited speaker), James Willis Consultants cc, Cape Town, Republic of South Africa
A review of the history and development of influence coefficients in XRF Spectrometry
1355 Aud Johnsen, Borregaard, Sarpsborg, Norway.
Prøvepreparering og analyse av metaller i cellulose og lignosulfonater
(Sample preparation and metal analysis of cellulosics and lignosulfonates)
1415 Dr. Elke Thisted, Elkem Central Laboratory, Kristiansand, Norway
Characteristics of cellulosics and starch as binder for Pressed Powder Samples
(Egenskaper ved cellulose og stivelse som bindemiddel for "Pressed Powder Samples")
1435 Coffee
1500 Marte Kristoffersen, North Cape Minerals AS, Lillesand, Norway
Pressede pulverbriketter av kvarts - bindemiddelproblem
(Pressed pellets of quartz - binder problem)
1515 Dr. Reinhold Schlotz., Fluxana, Germany
Fusion technology for xrf analysis
1535 Graham Rhodes, PANalytical, The Netherlands
Calibration (Important aspects to consider)
1620 End
1700 Departure from hotel entrance to Kristiansand Cannonmuseum.
2000 Dinner, Quality hotel.

 

Tuesday 7 September
  Chairman: Torkild Eivindson
0900 Dr. Lorentz Petter Lossius (invited speaker), Hydro Aluminium PM, Årdal, Norway
Using Quantitative XRD Phase Analysis to Improve Standardless XRF Elemental Analysis
0945 Dr. Andreas Grimstvedt, Geological Survey of Norway, Trondheim, Norway
Kvantifisering med XRD. Eksempel på "Full Pattern" kvantitativ analyse utført i MS-Excel
(Quantifying with XRD. Example of Full Pattern quantitative analysis with MS-Excel)
1005 Coffee
1030 Arne Eriksson, Spectral Solutions (Bruker AXS), Stockholm, Sweden
Super Speed Solutions in X-Ray Diffraction
1050 Uli Riedel, PANalytical , The Netherlands
Phase identification made easy! 2 practical examples how complex problems can be solved
1135 Lunch
  Chairman: Torkild Eivindson
1330 Dr. John Sieber (invited speaker), National Institute of Standards and Technology (NIST), USA
Traceability, validation & uncertainty in quantitative X-RAY fluorescence
1415 Stefan Kazikowski, Eka Chemicals AB, Sweden
Certifierade Standarder, Pulver och Glas. Utvärderade med UniQuant/IQ+
(Certified Standards, Powder, and Glass. Examined with UniQuant/IQ+)
1435 Dr. Bertil Magnusson, SP, Sweden
Measurement uncertainty according to the Nodtest Handbook – Example with determination of Si with XRF.
1505 Coffee
1530 Clemens Schäfer, Spectro A.I., Germay
Micro XRF, filling the gap between SEM/EDS and conventional XRF
1615 Dr. Elke Thisted, Elkem Central Laboratory, Kristiansand, Norway
XRF analysis of P in Si-metal
1635 Didier Bonvin, Anton Kleyn and Ravi Yellepeddi, Thermo Electron Corp. Switzerland
Matching XRF Solutions with Analytical needs: Challenges and Choice
1720 Torkild Eivindson, Elkem Central Laboratory, Kristiansand, Norway
Analyseprogram for kontroll av XRF-instrument
(An analytical program to control an XRF-instrument)
1740 End
1930 Banquet

 

Wednesday 8 September
  Chairman: Marte Kristoffersen
0900 Prof. Emeritus James Willis (invited speaker), James Willis Consultants cc, Cape Town, Republic of South Africa
Calculation of theoretical intensities in XRF: The basis of all FP Models
0945 Dr. Reinhold Schlotz., Fluxana, Germany Fusion technology for xrf analysis
1005 Vibeke Vollan, Elkem Salten, Norway and Torkild Eivindson, Elkem Central Laboratory, Kristiansand Norway
Mini-XRF for produksjonskontroll i et FeSi/Si-metall smelteverk
(Mini-XRF for production control in a FeSi/Si metal melting plant)
1025 Coffee
1100 Michaela Banzhaf, Bruker AXS, Germany
Standardless Analysis with EDXRF - EQUA ALL
1120 Michael Mantler, Vienna University of Technology, Institute of Solid State Physics
Standardless XRF: Theoretical Considerations and Practical Limitations
1140 Closing remarks.
1200 Lunch