Invited speakers 2004.

We have invited three speakers for this year's seminar.

Lorentz Petter Lossius, Hydro Aluminium PM
Technology & Operational Support (T&OS)
ØVRE ÅRDAL, NORGE


Dr. Lossius will attend the use of XRD in the following presentation:

"Using Quantitative XRD Phase Analysis to Improve Standardless XRF Elemental Analysis"

Abstract (preliminary)
In addition to routine samples, our laboratory also receives samples from research. For some of the research samples we do not have XRF applications with standards, and we have to use standard-less XRF analysis, usually UniQuant. The analysis can be rather inaccurate. We usually do quantitative XRD phase analysis on the research samples. Since the compounds are well-defined stoichiometrically we can calculate an elemental composition of the major elements from teh XRD result. By comparing elements from XRF and XRD we can utilize the stoichiometry to improve the accuracy of the XRF result.
Research samples:
- new and used chamotte refractory for anode baking furnaces
- aluminium cell lining materials from SiC sidewall to molér-stone.

 

John Sieber
National Institute of Standards and Technology, NIST,
Gaithersburg, USA

Dr. Sieber's research interests include matrix-independent methods for XRF, fundamental parameters, spectroscopy tools, and novel instrumentation

His presentation will relate the worldwide metrology system and the need for comparability to the concepts of traceability, validation and uncertainty as they pertain to work in individual laboratories.

The title of his contribution being:

"TRACEABILITY, VALIDATION & UNCERTAINTY IN QUANTITATIVE X-RAY FLUORESCENCE"

 

James Willis,
James Willis Consultants cc, SOUTH AFRICA.

Emeritus Prof. James Willis, a world-renowned expert on the use of the XRF-technique, has kindly accepted our invitation to attend the seminar again.
His two contributions this year will be:

"A review of the history and development of influence coefficients in XRF Spectrometry"

"Calculation of theoretical intensities in XRF: The basis of all FP Models"