Maggi Loubser, PPC Cement, South Africa

Representative sampling and the errors introduced in sampling and sample preparation

 

Hege Zahl, on behalf of Elkem Solar Research, Norway

Quality control charting

 

Rainer Schramm, Fluxana GmbH & Co. KG, Germany

Analysis of ashes with XRF based on fused beads

 

Kohei Kansai, Rigaku Europe SE, Germany

X-ray fluorescence analysis of rocks by fusion method using a benchtop WD-XRF

 

Elke Thisted, Elkem Solar Research, Norway

Aging of a Li2B4O7 glass - 5 years of analysis

Routine XRD analysis on anode material - our experience

 

Elke Schwöbel, Bruker AXS GmbH, Germany

Quantitative XRD-analysis of phases with known, partial or no known crystal structures

 

Jakob Noreland, PANalytical B.V, Sweden

Using XRD in the hunt for cost and CO2 reductions in the metal and mining industry

 

Katarzyna Mirek-Sliwa, Darrell Harman, Lorentz Petter Lossius, Hydro Aluminium, Norway/Australia

Advantages in use of the Multivariate Regression (MVR) method in the XRD bath acidity analysis

 

Stein Rørvik, SINTEF, Norway

A review of problems related to Lc  measurements by XRD of carbon materials

 

V. K. Egorov, E. V. Egorov, Institute of microelectronics technology Russian academy of science, Russia

Waveguide-resonance propagation mechanism for X-ray flux and it's realization conditions

 

Renaat van Geel, D.Bonvin, Thermo Fisher Scientific, The Netherlands/Switzerland

Concept differences in an XRF goniometer system

 

Akihiko Iwata, Rigaku Europe SE, Germany

Developement of a high brilliance rotating anode dual-wavelength X-ray generator and multi-layer mirror for dual-wavelength

 

Lorentz Petter Lossius, Hydro Aluminium, Norway

XRF of Aluminium Fluoride - Interlaboratory Study for ISO Precision

 

Hege Indresand, Crocker Nuclear Laboratory, University of California Davis, USA

Advanced Reference Materials for XRF Analysis in the US IMPROVE Atmospheric Particulate Matter Network.

 

M.Haschke, U.Rosseck, R.Tagle, U. Waldschläger and H.Wagenknecht, Bruker Nano GmbH, Germany

Ultra-fast and sensitive element distribution measurement using micro-XRF

 

Torfinn Fongen, Holger Teknologi, AS, Norway

Uses of portable XRF

 

Kevin Young, Peter Sheppardson, Sibelco Europe, England

Practical Aspects of the X-ray Characterisation of Silicate and Alumino-silicate Industrial Minerals

 

P.Lemberge, Renaat van Geel,  TermoFisher Scientific, Switzerland

F. Herzog, M.S. Krzemnicki, Swiss Gemmological Institute SSEF, Switzerland

ED-XRF analysis to determine the origin and authenticity of gemstones

 

Armand Jonkers, PANalytical, The Netherlands

Advances in standardless analysis

 

Ingvar Bernhardsson, D-LAB, Sweden

Multi base, multi range calibration

 

Dirk Wissmann, SPECTRO Analytical Instruments GmbH, Germany

XRF-Calculation of results empirical, semi-empirical, fundamental parameters - versatility vs. precision vs accuracy