Professor Jay R. Turner, (Invited speaker), Washington University in St. Louis, USA

“XRF-Based High Time Resolution Measurement of Airborne Particulate Matter Metals”


Dr. Nicole P. Hyslop, (Invited speaker), Improve Research, USA

“XRF Reanalysis of a 15-year archive of IMPROVE samples”


PhD Hege Indresand, Teknova, Kristiansand, Norway

“Solving an XRF data mystery in PM analysis”


Bertil Magnusson, SP Technical Research Institute of Sweden

“Eurachem - support for analytical chemists during the 25 years



David E. Simon, (Invited speaker), DES Consulting, Bartlesville, OK,

“Phase filter analysis of materials – the new x-ray diffraction technology”


PhD Julian Tolchard, NTNU/SINTEF, Trondheim, Norway

“RECX: An update on the National Centre for X-ray Scattering”


PhD Julian Tolchard, NTNU/SINTEF, Trondheim, Norway

“Beyond Routine: XRD in the NTNU Labs”


Stein Rørvik, SINTEF, Trondheim, Norway

“Petroleum Coke Structure issues Studied by X-ray Diffraction”


Lorentz Petter Lossius, K. Bolstad, K. Gulbrandsen, Hydro Aluminium ASA, Årdal Norway

 “Preparing a Multi-Phase Calibration Combining XRD Rietveld and Combustion Analysis”


Arne Eriksson, Bruker AXS Nordic, Sweden

“The use of Rietveld method in industrial XRD applications"


Thor Lichtentahler, Matriks/Rigaku

“Low background, low angle measurements with built in XRF suppression on the MiniFlex 600”


Jacob Noreland, PANalytical B.V., Vällingby, Sweden

“New features in analysis software for powder diffraction”


Kurt Juchli, Thermo Scientific

“Analysis of layers and coatings by X-ray fluorescence”


Susanne Kaun, Hanne Moltubakk Kempton, Norsk institutt for kulturminneforskning (NIKU)

“Identifying pigments in multiple paint layers using portable XRF”


Rainer Schramm, FLUXANA

“New electrical fusion system”


Frank Portala, K. Behrens, S. Durali-Mueller, Bruker AXS, Karlsruhe Germany

“Effective Grade Control in Mining by EDXRF-Benefits and Limitations of New Analytical Technologies”


Damien Blondel, Olympus Europa

"XRD infield measurements"

Damien Blondel, Olympus Europa

"Hot surface measurement with XRF" 

Armand Jonkers, PANalytical

“Advances in table top EDXRF”


Sébastien Rivard, Mathieu Bouchard and Alex Milliard, Corporation Scientifique Claisse®

“Calibration strategies for XRF applications using sample preparation by borate fusion – Practical example for chlorine analysis in the cement industry”


Pol de Pape, Rigaku

“Alternative Applications with WD-XRF”