The following speakers will give presentations at the 19th Norwegian X-Ray Conference. More speakers will be announced soon, and it is still possible to register a presentation by using our registration form.
Johan Boman, Ph. D. in Physics, TXRF – pros, cons and applications
Michael W. Hinds, Assay Chemist, Royal Canadian Mint, Ottawa, ON, Canada, Challenges of Applying XRF Spectrometry to Gold Refining Operations
Robert W. Morton, Ph. D. in analytical chemistry
Read more about our invited speakers here.
Svenerik Bäckman, D-Lab - DECIPHER, software for translation of intensities to concentration
Patrick Galler, Elkem Technology - On the challenges of harmonized XRF calibrations in an industrial setting
Hlynur Sigurbjörnsson, Elkem Iceland - Cubix XRF from Iceland to Paraguay
Hagen Stosnach, Bruker Nano - Latest development in TXRF Applications and Instrumentation
Christophe Fougntaine, Thermo Fischer, Real-Time X-ray Diffraction and Applications
Christian Hansson, Bruker AXS Nordic - XRD for Quantitative Rietveld Phase Analysis of Mineralogy
Julius Hållstedt, Excillum - High Brilliance X-ray Sources Based on Metaljet Technology
Lorentz Petter Lossius, Hydro Aluminium - Analysis of a Complex Material by XRD Rietveld Phase Determination to Establish a Calibration Set for Peak Height Quantification
Frederic Davidts, XRF Scientific - XRF FUSION: THE USE & CARE OF PLATINUM LABORATORY WARE
Anders Pihl, Retsch Norge, Sampling/dividing - fra produksjonsstrøm til anayseprøve.
Rainer Schramm, Fluxana - Applications of Borate Fusion in Steel Industry
Topics that will be covered in detail:
WDXRF (latest developments from suppliers, preparation of tests, user experience)
EDXRF (latest developments from suppliers, online XRF, user experience)
TXRF (recent trends in development, usage potential)
XRD (latest developments from suppliers, user experience)
The full program will be announced in June/July